[1] Wanling Deng, Junkai Huang, Xiaoyu Ma, Juin J. Liou, Fei Yu. A compact drain current model for heterostructure HEMTs including 2DEG density solution with two subbands. Solid-State Electronics, 2016，115： 54–59.
[2] Xiaoyu Ma, Junkai Huang, Jielin Fang, Wanling Deng*. A compact model of the reverse gate-leakage current in GaN-based HEMTs. Solid-State Electronics， 2016，126 ：10–13
[3] Wanling Deng, Junkai Huang, Xiaoyu Ma, Juin J. Liou. An Explicit Surface Potential Calculation and Compact Current Model for AlGaN/GaN HEMTs. IEEE Electron Device Letters, 2015, 36(2): 108-110.
[4] Wanling Deng, Junkai Huang, Xiaoyu Ma, Tao Ning. An explicit surface-potential-based model for amorphous IGZO thin-film transistors including both tail and deep states. IEEE Electron Device Letters, 2014, 35(1): 78-80.
[5] Wanling Deng, Junkai Huang, Xiyue Li. Surface-Potential-Based Drain Current Model of Polysilicon TFTs With Gaussian and Exponential DOS Distribution. IEEE Trans. Electron Devices, 2012, 59(1): 94-100.
[6] Wanling Deng, Junkai Huang. A Physics-Based Approximation for the Polysilicon Thin-Film Transistors Surface Potential. IEEE Electron Device Letters, 2011,32(5): 647-649.